Optics is our core value

  +603-76136915   P1-30 Lumi Tropicana, Persiaran Tropicana, 47800

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

By running in parallel with the Wafer Review System, the pre-shipment inspection 
will be able to perform without reducing inspection throughput.

By AI function, it learns the state of true defects, so it accurately sorts suspicious defects 
and improves the yield.

Chip Visual Inspection
Internal Defect Inspection (IR Inspection)

Available wafer size
4 inch, 6 inch
8 inch, 12 inch Wafer with Dicing Ring Frames, TAIKO Grind wafer

The joy of being useful to the world and the real thrill of manufacturing. That is the charm of Seiwa.

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This is a staging environment